Sheikhi, S., Kim, E., Duggirala, P. S., & Bak, S. (2022). Coverage-Guided Fuzz Testing for Cyber-Physical Systems. In (pp. 24–33). Milano, Italy: IEEE. http://doi.org/10.1109/ICCPS54341.2022.00009 (Original work published 2025)
First name
Edward
Last name
Kim